Joint Technical Event from IEEE EMC Society German Chapter and Rohde & Schwarz

Joint Technical Event from IEEE EMC Society German Chapter and Rohde & Schwarz

Date
Date

July 4th, 2024
13:00 to 18:00 CEST

Register now
国家/地区
国家/地区

R&S headquarter Munich, Germany or online

EMC

Joint technical event featuring EMC talks

Join us for this technical event from IEEE EMC Society German Chapter and Rohde & Schwarz featuring EMC Talks by Dr. Benoit Derat and Dr. Adam Tankielun.

On-site participants can network with industry colleagues and students during the social event and tour the EMC test facility at Rohde & Schwarz headquarter Munich.

Date: July 4th
Time: 13:00 to 18:00 CEST

Please register for this event and choose your form of participation. Seats on site are limited.

We are looking forward to meeting you in Munich.

Agenda

Time Topic
(30-45 min talk + 15 min Q&A)
Presenter
13:00 – 14:00 Visitor registration & Coffee
14:00 – 15:00 How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range Dr. Benoit Derat
15:00 – 16:00 Broadband antenna designs for EMC testing in 18 to 40+ GHz range Dr. Adam Tankielun
16:00 – 17:00 EMC chamber tour (30 min)
Demo room tour (30 min)
All
17:00 – 18:00 Get together (snacks + drinks) All

Our presenters

Dr. Benoit Derat

Dr. Benoit Derat

IEEE EMC Society Distinguished Lecturer, Term 2024-2025
Senior Director for Systems Developments and Project Implementations, Rohde & Schwarz

EMC-S Distinguished Lecture: How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range

Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC, or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric, and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.

Dr. Adam Tankielun

R&D Hardware and Solutions - Antenna Test, Rohde & Schwarz

Adam Tankielun earned his Master of Science in Engineering (mgr inż.) in electrical engineering from the Technical University of Gdańsk in 2002, followed by his Doctor of Engineering (Dr.-Ing.) degree from Leibniz University Hannover in 2007. Between 2003 and 2008, he enhanced his expertise at the Fraunhofer Institute for Reliability and Micro integration in Paderborn, focusing on the development of electromagnetic near-field scanning techniques. Since 2008, he has been with Rohde & Schwarz in Munich, where he specializes in the development of broadband measurement antennas and over-the-air test systems for antennas and wireless devices. Dr. Tankielun is an inventor, with a portfolio of over 40 patents to his name.

How to find us

How to find us

Please download the directions to Rohde & Schwarz corporate headquaters in Munich.