高级眼图分析软件可结合眼图以及模板测试、直方图和自动化眼图测量等工具验证和调试信号完整性。

K135 enables PAM-N Analysis for teh RTO and RTP Oscilloscopes.

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Mar 26, 2024 | 新闻发布 | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

罗德与施瓦茨的新方法利用可配置的硬件时钟数据恢复 (CDR) 功能来提供信号的真实“实时眼图”，同时应用硬件 CDR 的时间信息来进行位分片，从而进行持续的位流分析，这不仅能够快速实现高统计置信度，还可以进行更深入的分析。

Learn about DisplayPort transmitter testing with Rohde & Schwarz.

In this webinar you will learn more about a novel way of capturing and measuring eye diagrams in hardware.

This webinar is intended for engineers working on high-speed digital interface designs and testing.

This example demonstrates the power of Advanced Eye analysis with the RTP oscilloscope on an Automotive Ethernet PAM4 signal at 5 Gbaud. PAM-N Analysis with the R&S RTP Oscilloscope (Part 3) Learn about key advantages of the PAM-N analysis option on the R&S RTP & RTO6 oscilloscopes together with the Advanced Eye option to characterize and verify signal transitions.

The Advanced Eye Analysis option enables on the R&S RTP oscilloscope utilizes a hardware-based Clock-Data-Recovery trigger (CDR). In combination with the PAM-N Analysis option this true CDR trigger operates also on PAM signals and enables a Live Eye diagram for continous monitor of the signal quality over hours or even days.

Mar 01, 2023 | 新闻发布 | Test & measurement

Embedded systems are at the core of today’s electronic devices, whether in consumer electronics, telecommunications, industrial, medical, automotive or aerospace applications. Flawless operation is crucial, and engineers face complex challenges when designing ever more compact embedded systems which meet today’s demands of efficiency, safety, reliability and interoperability. Rohde & Schwarz addresses these challenges with its wide-ranging test and measurement solutions showcased at the embedded world Exhibition & Conference 2023 in Nuremberg.