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168 结果
R&S®ZN-Z25 RFFE Cable with Adaptors - Specifications
校准, 准确度, METAS, ZNA, ZNB, ZN-Z270, ZN-Z235, ZN-Z229, 不确定度, 可追溯性, 可追溯的 S 参数 本视频简要总结了 METAS 研究如何为执行可追溯 S 参数测量的工程师提供助益。
射频微波及音频元部件 射频微波及音频元部件测量 备选仪器: 矢量网络分析仪ZNA,ZNB,ZNBT 射频和微波信号源SMA100A,SMA100B 示波器:RTO,RTP 音频分析仪UPV SMW200A双通道矢量信号源 信号分析仪/频谱仪 FSW 信号源分析仪FSWP 双通道直流电源HMP4040 自动通道切换开关OSP 应用领域: 有源、无源元部件的全参数测试,如电缆、转接器、滤波器、双工器、衰减器、耦合器、放大器等 变频器件全参数测试,包括多级变频的幅度、相位、延时精确测试 真实差分元部件测试,对于真实差分信号驱动的器件进行测试 多通道一致性测试,包括幅相及延时一致性测试 特殊连接方式和阻抗的器件测试 脉冲元部件测试 相噪测试 VCO性能测试 A/D变换器测试 噪声系数测试 时域分析 音频元部件测试 测试软件和系统验证 在片测试
稳定的射频组件量产测试解决方案,保证质量始终如一。罗德与施瓦茨提供先进的测试解决方案,涵盖在片测试到最终设备测试。
Jan 25, 2022 | 新闻发布 | Test & measurement
Automotive Ethernet test solutions from Rohde & Schwarz accelerate Realtek’s entry into the automotive marketRohde & Schwarz, a leading global test & measurement company, is partnering with the automotive chipset development team of Realtek, one of the world’s foremost network and multimedia fabless IC design companies to ensure compliance with current and future OPEN Alliance standards.
本应用指南描述了对高速背板和直连铜缆 (DAC) 进行精确、快速、无误的一致性测试的实现方法 (MOI)。
4月 07, 2021 | AN-No. GFM356
本应用指南描述了对高速背板进行精确、快速、无误的一致性测试的实现方法 (MOI)。
4月 07, 2021 | AN-No. GFM357
Using network analyzers to measure fluids, gels and solids - White Paper
Visit Rohde & Schwarz at the Embedded world 2024 in Nuremberg for the test & measurment solution you need.
As DisplayPort evolves to support ultra-high resolutions and increased data rates, robust compliance testing is essential to ensure interoperability across devices and interconnects. This application note provides a structured overview of physical-layer testing for DisplayPort source transmitters and passive cables, aligned with VESA CTS v2.1. The note covers key test procedures using Rohde & Schwarz solutions, including oscilloscope-based measurement at standardized test points, automated test execution with ScopeSuite, and signal integrity debug via equalization and jitter decomposition. It further details cable characterization using mixed-mode S-parameter analysis on a Vector Network Analyzer (VNA), with support for simulated eye diagrams and TDR-based impedance diagnostics. Practical setup examples and product references are provided to help engineers perform repeatable, standards-compliant DisplayPort PHY validation.
Jul 16, 2025 | AN-No. 1SL418
Generating models with a VNA and using these on an oscilloscope via the deembedding
May 23, 2023 | AN-No. 1SL393
R&S®ZNx-K100 SNP Assistant - Fact Sheet 手册及数据表
适用于罗德与施瓦茨仪器的多功能软件工具RSCommander 是一款多功能软件工具,适用于各式各样的罗德与施瓦茨频谱分析仪、网络分析仪、信号发生器以及示波器。它能够自动发现仪器、创建屏幕截图、读取迹线、传输文件以及创建简单脚本。
12月 24, 2017 | AN-No. 1MA074
R&S ZN-Z15 RFFE Interface - Specifications
Know your jitter when debugging - White Paper
Efficient analysis of power and signal integrity and EMC - Flyer
Where history meets tomorrow - Vector Network Analyzer - Flyer 手册及数据表 Flyer
Sep 06, 2022 | 新闻发布 | Test & measurement
From gigahertz to terahertz, Rohde & Schwarz exhibits latest mmWave test solutions at EuMW 2022 in MilanRohde & Schwarz will showcase at EuMW in Milan the latest testing capabilities for microwave components and new solutions for the road to 6G.
此应用说明回顾了由内嵌校准单元 (ICU) 组成的新校准子系统。这些 ICU 专为现场使用而设计,所以在校准过程中和被测设备 (DUT) 的测量过程中都保留在原位。这为基于 VNA 的测量系统增加了多功能性、方便性和准确性,因为这意味着可以随时刷新校准,而无需手动将 DUT 从测试系统断开。
9月 29, 2017 | AN-No. 1EZ71
Perform interface tests during your USB design process and verify the compliance with USB test solutions from Rohde & Schwarz > Get more information!
Jan 18, 2023 | 新闻发布
Rohde & Schwarz to host Digital Debug Design challenge at DesignCon 2023At DesignCon 2023, Rohde & Schwarz will not only showcase live demos covering the latest industry trends, attendees will also be able to test their knowledge at the interactive Rohde & Schwarz “Are you a genius?” Digital Debug Design challenge. Plus, Rohde & Schwarz will offer a full-day workshop in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and Missouri University of Science & Technology.
Join RF experts from Rohde & Schwarz and the industry live and online for the first time at the RF Testing Innovations Forum 2025!