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This document provides the technical specifications of the R&S®Fxx-K30 noise figure measurement application.

此应用指南提供了有关频率和相位稳定时间测量的基本信息，并介绍了如何使用现代相位噪声分析仪执行测量。

6月 28, 2018 | AN-No. 1EF102

本文介绍的替代方法采用了可直接降频转换 DUT 信号的低相位噪声本振。

5月 09, 2016

推荐使用具备时频域分析能力的抖动测量仪表来进行分析，以区分被测信号的快速和慢速变化的失真。

8月 22, 2017

This paper describes the measurement of additive/residual phase noise of power amplifiers or multipliers for example for automotive RADAR sensors at 80 GHz using the interferometric measurement approach in combination with a phase noise and VCO tester R&S FSWP. The setup provides a way to characterize the additive/residual phase noise of amplifiers down to -150 dBc/Hz at 100 kHz offset even in the microwave range at 80 GHz.

Sep 11, 2024 | AN-No. 1EF117

提供所需信息完成使用前准备工作，并开始使用仪器。介绍基本操作和处理方法。

Jun 21, 2023 | 新闻发布

Rohde & Schwarz and Zurich Instruments will present advanced test and measurement solutions for photonics at the LASER World of PHOTONICS tradeshow in Munich. Highlighted solutions include the R&S FSPN and R&S FSWP, two exceptionally powerful phase noise analyzers for characterizing laser systems. Visitors can also see demos of the R&S MXO 4 and R&S RTO6 oscilloscopes from Rohde & Schwarz as well as the Quantum Computing Control System (QCCS) and lock-in amplifiers from Zurich Instruments.

描述 R&S®FSWP 中的存储器类型及使用，以及在安全环境中的操作问题。 USB 写入保护工具会禁用存储设备 USB 端口的写入功能。本手册描述了安装和使用信息。针对不同操作系统提供不同版本。

罗德与施瓦茨的新型 R&S®FSWP 相位噪声和 VCO 测试仪在灵敏度和测量速度方面树立了新标准。 罗德与施瓦茨的新型 R&S®FSWP 相位噪声和 VCO 测试仪在灵敏度和测量速度方面树立了新标准。R&S®FSWP 一键执行复杂测量，适用于高性能雷达和通信系统应用。相位噪声测试仪还可升级为信号与频谱分析仪。 R&S®FSWP, FSWP, 相位噪声, VCO 测试仪 罗德与施瓦茨的新型 R&S®FSWP 相位噪声和 VCO 测试仪在灵敏度和测量速度方面树立了新标准。

介绍关于基本单元的所有仪器功能和远程控制命令，包括测量和编程示例。此外还介绍了适用于多种应用的一般功能。 包含入门手册内容。 在线版本包含 R&S®FSWP 基本单元和所有选件的相关文档，可直接显示（无需下载）。

罗德与施瓦茨的 R&S®FSWP 相位噪声和 VCO 测试仪可以在超出 50 GHz 的频率下高度精确地测量相位噪声。 罗德与施瓦茨的 R&S®FSWP 相位噪声和 VCO 测试仪可以在超出 50 GHz 的频率下高度精确地测量相位噪声。借助互相关技术以及外部谐波混频器，用户可以更加简单、快速、精确地测量低相位噪声信号。 R&S®FSWP, FSWP, 相位噪声, VCO 测试仪 罗德与施瓦茨的 R&S®FSWP 相位噪声和 VCO 测试仪可以在超出 50 GHz 的频率下高度精确地测量相位噪声。

Aug 14, 2025 | 新闻发布

Rohde & Schwarz invites attendees to EuMW 2025 in Utrecht to “Discover the next wave of test and measurement” at booth A026 in the Jaarbeurs Utrecht. A key highlight of the exhibition will be the game-changing FSWX signal and spectrum analyzer.

High‑end analysis of signal sources and components The R&S®FSWP with its outstanding sensitivity to measure phase noise is now additionally equipped with the Noise power ratio (NPR) option. The R&S®FSWP with its outstanding sensitivity to measure phase noise is now additionally equipped with the Noise power ratio (NPR) option.

Jan 18, 2023 | 新闻发布

Rohde & Schwarz introduces improved performance for phase noise analysis and voltage-controlled oscillator (VCO) measurements. Both the high end R&S FSWP phase noise analyzer and VCO tester plus signal and spectrum analyzer in one instrument, and the R&S FSPN dedicated phase noise analyzer and VCO tester, are now upgraded. Simultaneous hardware and software upgrades improve the market-leading performance even further, reducing noise levels and measurement times, and increasing accuracy. Both analyzers include test sequence recording functions (SCPI recorder), unique for this class of instrument.

了解如何使用低噪声信号发生器 R&S®SMA100B 和相位噪声分析仪 R&S®FSWP 针对 IDT 微波合成器获得出色的相位噪声测量结果。 本振相位噪声, R&S®FSWP, R&S®SMA100B 了解如何使用低噪声信号发生器 R&S®SMA100B 和相位噪声分析仪 R&S®FSWP 获得出色的相位噪声测量结果

了解如何使用矢量信号发生器 R&S®SMW200A（包括相位噪声剖面选件）和高性能频谱与相位噪声分析仪 R&S®FSWP 测量 IDT 射频采样时钟发生器/抖动衰减器的重新锁定周期参数。 时钟输入监控, R&S®SMW200A, R&S®FSWP 了解如何使用矢量信号发生器 R&S®SMW200A（包括相位噪声剖面选件）和高性能频谱与相位噪声分析仪 R&S®FSWP 测量射频采样时钟发生器/抖动衰减器的重新锁定周期参数。

Dec 02, 2021 | 新闻发布

AFMETCAL, the Air Force Metrology and Calibration Authority, has ordered signal source analyzers (SSA) from Rohde & Schwarz. They will be operated in AFMETCAL’s precision measurement equipment laboratories (PMEL’s) and Air Force primary standards laboratory (AFPSL). The signal source analyzers are used for calibration of phase noise analog (AM, FM & PM) and digital modulation measurements. For phase noise measurement Rohde & Schwarz has also provided cross-correlation offering very high sensitivity, flexibility and fast measurement speed — all in one box.

Jun 03, 2025 | 新闻发布

At the International Microwave Symposium IMS 2025 in San Francisco, Rohde & Schwarz will highlight its newest test instrument that will enable RF engineers to discover signals once out of reach. In addition, updates for the tried and tested R&S FSWP phase noise analyzer as well as the latest vector network analyzer R&S ZNB3000 will be on display. With the IMS workflow passport challenge, the company organizes a fun way to experience RF design workflows across multiple show booths.

Efficient analysis of power and signal integrity and EMC - Flyer

Jan 20, 2025 | 新闻发布

Rohde & Schwarz, a leading provider of high-performance test and measurement solutions, has announced their plans for the upcoming DesignCon 2025 tradeshow.

ARB Toolbox 是一款易于使用、功能齐全的软件包，可用于多种任意波形相关任务。

12月 13, 2018 | AN-No. 1GP88

对于 50 GHz 以上频率范围的相位噪声测试，可以采用由两个外部谐波混频器和商用相位噪声测试仪组成的测量装置。理论上而言，此装置可以测量频率高达 500 GHz 的信号源。

2月 05, 2018 | AN-No. 1EF101

5G 基站, SMA100B, FSWP, 差分时钟, 相位噪声 本视频展示了 IDT 时钟发生器和射频合成器，并介绍了这些组件的相位噪声测量。

相位噪声分析仪具备一流的相位噪声灵敏度，是执行此类测试的首选仪器。

5月 08, 2018

Sep 03, 2024 | 新闻发布

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

5G 基站, SMW200A, FSWP, 时钟输入监控, 保持, 重新锁定, 相位噪声剖面, 相位瞬变 本视频展示了 IDT 时钟发生器，并介绍了锁定-保持-重新锁定-锁定循环中的相位瞬变测量。

Oct 05, 2021 | 新闻发布

For high speed, real-time phase noise measurements using sources that require high stability in demanding applications, the new R&S FSPN from Rohde & Schwarz has superb sensitivity, accuracy and reliability. As a pure phase noise analyzer and VCO tester, the R&S FSPN provides an unrivaled combination of performance and ease of use.

测量电源噪声抑制 (PSNR)，需要准确生成和调整人为正弦干扰，并测量相应造成的相位噪声和抖动损耗。

9月 30, 2020

This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.

Specifications of R&S®VSE-K60(x) / FSx-K60(x) Transient Measurements