220 结果
R&S®FE110 | FE170 External Frontends | 外部前端 - Product Brochure
FSW信号与频谱分析仪、R&S®RTP示波器、R&S®SMW200A和R&S®SMM100A矢量信号发生器以及R&S®SFI100A宽带中频矢量信号发生器可以使用R&S®FE110SR/R&S®FE170SR外部RX前端或者R&S®FE110ST/R&S®FE170ST外部TX前端，将频率范围扩展至110 GHz/175 GHz以支持宽带信号的分析和生成应用。这些前端的经过充分的校准，可以通过智能附件与仪器主机直接相连并实现频率扩展，能最大程度地减少与主机的连接数量，简化了操作。
Towards 6G: MIMO measurements up to 110 GHz
The new R&S FE110ST/SR TX/RX frontends extend the frequency range of Rohde & Schwarz signal sources such as the R&S SMW200A vector signal generator and signal analysis instruments such as the R&S RTP oscilloscope to cover the W band from 70 GHz to 110 GHz. They complement the company’s portfolio of easy-to-mount frontends.
RF signal analysis with Rohde & Schwarz spectrum analyzers and oscilloscopes - Application Brochure
RF signal analysis with Rohde & Schwarz spectrum analyzers and oscilloscopes - Application Brochure
Buy more - Save more | Customize your oscilloscope configuration and save big - Flyer
Buy more - Save more | Customize your oscilloscope configuration and save big - Flyer 手册及数据表 Flyer
揭秘 5G——5G 基站中系统参考信号和采样时钟信号的定时校正和延迟调整
5G 基站, SMA100B, RTP, 差分时钟, 定时校正, 延迟调整, 系统参考, 采样时钟, ADC, DAC 本视频展示了 IDT 时钟发生器，并介绍了系统参考信号和采样时钟信号的时间校正与延迟调整测量。
DisplayPort: Compliance and Signal Integrity Debugging
As DisplayPort evolves to support ultra-high resolutions and increased data rates, robust compliance testing is essential to ensure interoperability across devices and interconnects. This application note provides a structured overview of physical-layer testing for DisplayPort source transmitters and passive cables, aligned with VESA CTS v2.1. The note covers key test procedures using Rohde & Schwarz solutions, including oscilloscope-based measurement at standardized test points, automated test execution with ScopeSuite, and signal integrity debug via equalization and jitter decomposition. It further details cable characterization using mixed-mode S-parameter analysis on a Vector Network Analyzer (VNA), with support for simulated eye diagrams and TDR-based impedance diagnostics. Practical setup examples and product references are provided to help engineers perform repeatable, standards-compliant DisplayPort PHY validation.
Jul 16, 2025 | AN-No. 1SL418
MIPI D-PHY: Debugging and compliance testing
MIPI D-PHY is a low-power, cost-effective physical layer interface, essential in mobile devices and advanced technology systems. It's a high-speed, source-synchronous interface used in smartphone cameras, smartwatch displays, drones, in-car entertainment, automobile cameras, and radar sensors. This application note explores MIPI D-PHY's features, functionality, and testing practices for device compliance, addressing common issues. It highlights Rohde & Schwarz's equipment for ensuring compatibility and solving issues with MIPI D-PHY, aligned with MIPI D-PHY specification version 2.5.Developed by the MIPI Alliance, D-PHY connects cameras and displays to a host processor via CSI-2 or DSI protocols. It features a master-slave, asymmetrical design for reduced link complexity. Key aspects include a unidirectional clock, optional data signal directions, different data rates for half-duplex operation, point-to-point communication, and high-speed (HS) and low-power (LP) modes for data transfer and battery preservation. In HS mode, D-PHY uses differential signaling with specific impedance, while in LP mode, it operates in a single-ended manner with high impedance termination.The application note from Rohde & Schwarz provides insights into characterizing and debugging MIPI D-PHY, offering conformance verification with MIPI Alliance standards and protocol decoding options.
Jan 31, 2024 | AN-No. 1SL410
Deembedding Test Fixtures For High-Speed Digital Applications
Generating models with a VNA and using these on an oscilloscope via the deembedding
May 23, 2023 | AN-No. 1SL393
Making quantum computing ready for the real world - Case Study
Testing the world’s first quantum error correction stack
如何使用罗德与施瓦茨 IVI.NET 仪器驱动程序
本应用指南介绍了如何在 Visual Studio 环境中使用罗德与施瓦茨 IVI.NET 仪器驱动程序。
5月 31, 2016 | AN-No. 1MA268
Signal model based approach to joint jitter and noise decomposition - First published at DesignCon 2020 - White Paper
Signal model based approach to joint jitter and noise decomposition - First published at DesignCon 2020 - White Paper
Nov 09, 2022 | 新闻发布
Rohde & Schwarz next generation oscilloscope R&S MXO 4 on center stage at electronica 2022Rohde & Schwarz showcases at electronica 2022 (booth A3.307) the new R&S MXO 4 oscilloscope plus a wide range of test and measurement solutions tailored to developers and test engineers.
Selecting your next oscilloscope: Why digital triggering matters | 选择下一代示波器: 数字触发的重要性 - White Paper
本白皮书包含以下内容：- 模拟和数字触发架构 - 数字触发示波器的优势 - 如何辨别数字或模拟触发示波器
Selecting your next oscilloscope: Why fast update rate matters | 选择下一代示波器: 为什么更高的波形捕获率很重要 - White Paper
Selecting your next oscilloscope: Why fast update rate matters | 选择下一代示波器: 为什么更高的波形捕获率很重要 - White Paper 手册及数据表 White Paper
Decoding secondary surveillance radar
Secondary surveillance radar (SSR) bridges the gap between communications systems and classic radar systems. Despite the increasing capabilities of mobile communications, SSR remains a major component in airspace surveillance.
May 17, 2021
Sep 06, 2022 | 新闻发布
From gigahertz to terahertz, Rohde & Schwarz exhibits latest mmWave test solutions at EuMW 2022 in MilanRohde & Schwarz will showcase at EuMW in Milan the latest testing capabilities for microwave components and new solutions for the road to 6G.
使用 VSE-K6 进行时域和频域射频脉冲测量
此应用指南关注使用 R&S®RTO 数字示波器进行信号测量，以及输出 I/Q 数据以进行处理。
10月 18, 2016 | AN-No. 1MA249
Power electronics T&M solutions | Component testing, product design, production and compliance testing - Flyer
Power electronics T&M solutions | Component testing, product design, production and compliance testing - Flyer 手册及数据表 Flyer
R&S®RT-ZM Modular Probe System | モジュラープローブ・システム - Flyer
このR&S®RT-ZM モジュラープローブ・システムは、現在のプロービング要件に対応する、高度な技術と使いやすさを兼ね備えたソリューションです。