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PCI Express Gen 3 – 一致性和调试测试

PCI Express Gen 3 - compliance and debug testing

本网络研讨会面向从事高速数字设计和测试工作的工程师。我们将重点讨论 PCIe Gen 3 接口。研讨会将介绍 PCIe 技术,并讨论有关一致性、协议触发和解码以及信号完整性调试的 PCIe 测试。

首先,我们将介绍系统互操作性验证。您将详细了解解码、串行触发、眼图测试、去嵌、阻抗控制和抖动分析,这有助于确定一致性测试失败的根本原因。研讨会将通过实例和演示来说明简单可靠的 PCIe 测试。

Jithu Abraham works for Rohde & Schwarz as a product manager for the UK, Ireland and the Benelux region, specializing in oscilloscopes. He enjoys all aspects of high-speed digital, wireless communication, efficient power conversion and all the challenges they bring. Jithu holds an engineering degree in electronics and communication from the Anna University in India and a master’s degree in RF systems from the University of Southampton. He has been working for Rohde & Schwarz for over 12 years.

Jithu Abraham