实时去嵌
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揭秘去嵌以测试高速数字和射频信号
本网络研讨会专门面向使用大量电缆、转换器、适配器、测试夹具和放大器等组件测量高速数字和射频信号的工程师。研讨会将探讨测量装置对测量结果的影响和相关测量方法，以帮助工程师获取被测设备的实际信号，确保满足多项标准的要求。
您将详细了解相关错误原因，例如带宽限制、阻抗失配、耦合和探测影响。我们将通过演示讨论和展示如何进行建模并消除这些错误。简单的去嵌流程包括一些关键步骤，例如定义系统参数、提取并导入 S 参数，以及观察去嵌响应。我们将借助示波器进行演示，并会使用必要的软件和实时硬件选件。
Guido Schulze has more than 20 years of experience in high-speed digital testing. For the last ten years, he has worked as a product manager for the oscilloscope product division at Rohde & Schwarz. He specializes in high-end models and their respective applications.
Jithu Abraham works for Rohde & Schwarz as a product manager for the UK, Ireland and the Benelux region, specializing in oscilloscopes. He enjoys all aspects of high-speed digital, wireless communication, efficient power conversion and all the challenges they bring. Jithu holds an engineering degree in electronics and communication from the Anna University in India and a master’s degree in RF systems from the University of Southampton. He has been working for Rohde & Schwarz for over 12 years.
