R&S®LCX LCR表功能多样，能够非常准确快速地执行测量。此设备非常适合具有挑战性的研发和生产应用。

Provides information on security issues when working with the R&S®LCX LCR meter in secure areas.

LCR 表 R&S®LCX100 和 R&S®LCX200 能够在宽频率范围内精确测量复阻抗和相应的分量值。

3月 14, 2022 | AN-No. 1GP132

Describes all instrument functions and remote control commands, including measurement and programming examples.

本应用指南适用于直流电源 R&S®NGL200、R&S®NGM200、R&S®NGP800、R&S®NGU201 和 R&S®NGU401 以及 LCR 表 R&S®LCX100 和 R&S®LCX200。

5月 19, 2022 | AN-No. 1GP135

​Accuracy estimation for R&S®LCX LCR meters - White Paper 手册及数据表 White Paper

The R&S®LCX LCR meters are versatile, extremely accurate and perform measurements quickly. They are ideal for challenging applications in research, development and production. Two instrument models and various options cover applications with a test signal frequency of up to 10 MHz. Internal and external bias functions, comprehensive analysis options and versatile test fixtures expand the wide range of possible applications.

R&S®LCX LCR 錶功能多樣，能夠非常準確快速地執行量測。此設備非常適合具有挑戰性的研發和生產應用。LCR 錶提供兩種儀器型號和多種選配，測試訊號頻率高達 10 MHz，可用於廣泛的應用。內部和外部偏置功能、豐富全面的分析選配和多功能測試治具進一步擴展了儀器適用的應用範圍

Mar 15, 2022 | 新闻发布 | Test & measurement

With a completely new family of high performance LCR meters, the frequency range of impedance measurements provided by Rohde & Schwarz test equipment is dramatically extended to cover AC components operating from 4 Hz to 10 MHz, supporting all practical applications. The R&S LCX family of LCR meters serves all established impedance measurements plus specialized measurements for selected component types and provides both, the high accuracy required in R&D, and the high speed needed in production test and quality assurance.

Models: R&S®LCX100, R&S®LCX200

Models: R&S®LCX100, R&S®LCX200

适用于测定 LCX100 和 LCX200 测量精度的计算工具。

5月 11, 2023 | AN-No. 1GP138

为首次进行测量的用户提供有用建议和技巧

电阻器、电容器和电感器是电路的基本元件。这些元件必须确保正常、准确地运作。因此，需要在电路设计期间充分测试这些元件。测试通常使用实验室和生产中必不可少的 LCR 表来进行。 本应用指南探讨了如何准确可靠地执行电容器和电感器基础测量。

2月 22, 2024 | AN-No. 1GP142

R&S®LCX LCR 表的频率高达 10 MHz，并具备高分辨率触摸屏、多种测量功能和记录功能 R&S®LCX LCR 表的频率高达 10 MHz，并具备高分辨率触摸屏、多种测量功能和记录功能 LCX, 组件测试, LCX100, R&S®LCX200, 主要特性 R&S®LCX LCR 表的频率高达 10 MHz，并具备高分辨率触摸屏、多种测量功能和记录功能

The R&S®LCX-Z5 test fixture is designed for measuring transformers in combination with the measurement functions of the R&S®LCX LCR meters. The R&S®LCX-Z5 test fixture is designed for measuring transformers in combination with the measurement functions of the R&S®LCX LCR meters. Transformer Testing, R&S®LCX200 and R&S®LCX-Z5 Transformer Testing With R&S®LCX200 and R&S®LCX-Z5

R&S®LCX LCR 表的扫描工具能够扫描测试信号频率、电平和直流偏置，从而进行动态阻抗测量。 R&S®LCX LCR 表的扫描工具能够扫描测试信号频率、电平和直流偏置，从而进行动态阻抗测量。 LCX, LCR, 扫描工具 R&S®LCX LCR 表的扫描工具能够扫描测试信号频率、电平和直流偏置，从而进行动态阻抗测量。

R&S®LCX-K108 选件支持用户为被测设备应用最高 10 V 的外部直流偏置电压和最高 200 mA 的内部直流偏置电流。 R&S®LCX-K108 选件支持用户为被测设备应用最高 10 V 的外部直流偏置电压和最高 200 mA 的内部直流偏置电流。 LCX, 组件测试, LCX-K108 扩展偏置功能 R&S®LCX-K108 选件支持用户为被测设备应用最高 10 V 的外部直流偏置电压和最高 200 mA 的内部直流偏置电流。

The top class in component testing

罗德与施瓦茨直流电源和 R&S®LCX LCR 表的网页、VNC 和 FTP

4月 27, 2023

设计隔离开关电源 (SMPS) 时，高频变压器非常关键。使用定制变压器进行设计时，漏感至关重要，有助于控制效率、开关元件最大额定电压和电磁干扰 (EMI) 等多种设计参数。此寄生参数必须进行准确测量。R&S®LCX LCR 表非常适合这种极具挑战性的测量任务。

2月 15, 2022

R&S®LCX LCR 表非常适合测量这些特性之间的相关性。

3月 17, 2022

R&S®LCX200 with R&S®LCX-K201 frequency upgrade - Fact Sheet 手册及数据表

R&S®LCX200 versus Hioki IM3536 - Comparison Sheet 手册及数据表

R&S®LCX100 versus Keysight E4980AL-032 - Comparison Sheet 手册及数据表

R&S®LCX200 versus Keysight E4980A - Comparison Sheet 手册及数据表

R&S®LCX200 versus Keysight E4980AL-052 - Comparison Sheet 手册及数据表

R&S®LCX - EU Declaration of Conformity

Provides the information required to prepare the instrument for use and start working.

Oct 01, 2024 | 新闻发布 | Test & measurement

Rohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.

Apr 29, 2025 | 新闻发布 | Test & measurement

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.