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Describes all instrument functions and remote control commands, as well as measurement and programming examples.

English - 2026年4月14日

Provides information on security issues when working with R&S®ZNB/ZNBT/ZNC/ZND in secure areas.

English - 2024年8月27日

This document provides basic information on hardware option R&S®ZNBT-Z14 "Handler IO Interface (external)" available for the R&S®ZNBT.

English - 2016年5月9日

Provides the information required to prepare the instrument for use and start working.

English - 2026年4月14日

English - 2026年4月30日

English - 2024年7月31日

Vector Network Analyzers (VNA) are gaining popularity in the Signal Integrity community as time domain measurement and analysis tools. VNAs with 8 ports or more can provide significant decreases in test time by migrating from a 4-port measurement system to an 8-port measurement system. For tight tolerance DUTs that are barely within the test limit lines, small increases in accuracy can be realized by testing all of the test parameters at once, because the entire test setup is at the same temperature. This application note discusses the thermal advantages of testing an 8-port DUT with the R&S ZNBT VNA. The use of the ZNBT to assess and debug two differential pairs in a 20-inch backplane is presented.

English - 2020年3月18日

Simplified Chinese - 2024年7月31日

English - 2025年7月23日

Simplified Chinese - 2026年4月30日

Simplified Chinese - 2025年7月23日

Describes the functionality of the external RFFE/GPIO interface R&S®ZN-Z15.

English - 2017年2月6日

Integrated beamformer ICs shrink the size of antenna feed electronics. Multiport network analyzers shrink the necessary test setup down to one instrument.

English - 2019年1月8日

With the start and spread of 5G communications services and new form factors such as wearables and foldable phones, an increasing number of flexible printed circuit boards (PCB) that support high frequency signals are being produced. These boards must exhibit excellent frequency characteristics. In the past, a PCB’s frequency characteristics were subjected to sampling inspection using a test coupon. For flexible PCBs, a new method is needed to provide repeatable and proper verification. The Yamaha® MP Series combined with the R&S®ZNBT vector network analyzer measure the high frequency characteristics of a production lot at high speed and high accuracy, enabling 100 % measurement of mass produced rigid and flexible PCBs.

English - 2020年1月27日

With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding

English - 2022年7月8日

Many applications in aerospace and defense as well as in mobile communication require a defined magnitude and phase relation between several signals, for example, to design a smart antenna array and it's distribution network, or to ensure accurate phase alignment between different transmitter or receiver chains of T/R modules. Magnitude can be measured with spectrum analyzers or power meters. For phase measurements, a vector network analyzer is the easiest, fastest and most accurate instrument.This application note shows how to measure the phase accurately between several signals using vector network analyzers of the R&S®ZNA, R&S®ZNB and R&S®ZNBT families.

English - 2019年7月11日

For measurements of non-connectorized devices, test fixtures, probes or other structures are used to adapt from the coaxial interface of the test setup to the device under test (DUT). For accurate measurements of the DUT, these lead-ins and lead-outs need to be characterized, so that their effects can be mathematically removed, i.e. de-embedded from the measurement results.This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND. As de-embedding is also essential in other test equipment like oscilloscopes, etc., this guide also describes, how lead-ins and lead-outs can be accurately characterized with a VNA and then exported as an S-Parameter file to be used by other test instruments.

English - 2022年9月19日

After a communications satellite is on its target orbit, several routines need to be performed in order to ensure proper performance from the transponders in the payload. The on-orbit measurements are a vital part of the maintenance of a live satellite as well. Operating a satellite channel for an on-orbit measurement rather than the intended application comes with significant opportunity cost and hence test duration needs to be minimized as much as possible. Rohde & Schwarz test and measurement equipment recommended in this paper is market leading not only in terms of measurement accuracy but also offers unparalleled speed of measurement. This application note focuses on satellite post-launch or on-orbit measurement and monitoring strategies used for satellite functionality checks when running maintenance routines. A complementary paper treats pre-launch payload measurements.

English - 2016年11月25日

Designing and implementing an active phased array antenna requires precise characterization of individual components and the integrated performance of the array. To ensure an accurate test of the intended adaptive nature of the active phased array antenna, the embedded algorithms need to be tested as well.This application note aims to explain test procedures and give recommendations towards characterization of the relevant parameters for active phased array antennas and their passive subsystem, as often used in applications for Mobile Communication and RADAR. This application note describes transmit signal quality testing, multi-element amplitude and phase measurement techniques both in receive and transmit cases and introduces a new automated test methodology antenna radiation pattern measurement over frequency. This paper also describes the test system used for transmit and receive module (TRM) characterization in active array antennas.

English - 2016年7月4日

This application note introduces the IVI High Speed LAN Instrument Protocol (HiSLIP) and outlines its features. HiSLIP is the successor to the VXI-11 LAN remote control protocol. This document also describes guidelines for using this protocol.

English - 2014年11月12日

Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain. By means of the inverse Fourier transform the measurement results can be transformed to the time domain. Thus, the impulse or step response of the DUT is obtained, which gives an especially clear form of representation of its characteristics. For instance, faults in cables can thus be directly localized. Moreover, special time domain filters, so-called gates, are used to suppress unwanted signal components such as multireflections. The measured data "gated" in the time domain are then transformed back to the frequency domain and an Sparameter representation without the unwanted signal components is obtained as a function of frequency. As usual, other complex or scalar parameters such as impedance or attenuation can then be calculated and displayed.

English - 2020年7月30日