文档及文章搜索

Provides the information required to prepare the instrument for use and start working.

English - 2025年10月15日

Describes all instrument functions and remote control commands.

English - 2026年4月13日

Provides the basic information required for remote control connections via SCPI.

English - 2025年7月16日

Provides information on security issues when working with R&S®MXO5C in secure areas.

English - 2026年4月28日

If you are selecting your next oscilloscope and want more insight on how to understand ENOB values measured and published by oscilloscope manufacturers, this document is for you. The effective number of bits (ENOB) is a way of quantifying the quality of analog to digital conversion. A higher ENOB means that voltage levels recorded in analog to digital conversion are more accurate. Understanding oscilloscope vendor-supplied ENOB values can be complex. This document focuses on interpretation of measured ENOB results made on oscilloscopes rather than the math behind ENOB calculations.

English - 2024年6月21日

Describes the R&S®SPLUS.

English - 2026年5月13日

Simplified Chinese - 2024年7月31日

English - 2026年5月7日

Simplified Chinese - 2026年5月7日

English - 2026年4月9日

Simplified Chinese - 2026年4月9日

English - 2024年7月31日

Automated test equipment (ATE) is a cornerstone in production facilities. Devices under test (DUT) have to be measured according to various limits to ensure safe and reliable operation for the user. A production facility must ensure that these tests are performed properly and cover all the necessary test cases. However, the tests must also be executed with sufficient speed. Oscilloscopes (e.g. the MXO series from Rohde & Schwarz) are often a typical part of ATE and can improve the workflow with a dedicated “waiting for trigger” signal.

English - 2024年5月30日

Today’s complex circuits must integrate several components that feed on different power levels. A robust circuit that ensures interoperability of these components needs carefully designed, clean and stable power distribution networks for power timing. At lower voltage levels, tolerance is defined in percentages and can make precise measurements challenging.

English - 2024年4月22日

More functions, greater processing power and growing data rates make high-speed system-on-chips (SoCs) power designs challenging. The increasing number of power rails that supply the various function blocks of modern CPUs, GPUs, FPGAs, ASICs and such require precise sequencing during power-up and powerdown. Supply voltage levels are also lowered to reduce power dissipation inside the SoC. Power integrity requirements are stricter and more supply current is needed on power rails. Multiphase buck converters continue to grow more popular for high-current power rails. The converters have many benefits, but designers also face challenges when it comes to power design and validation testing.

English - 2025年1月13日