Challenging measurements on a GaN-FET power optimizer

This session takes a closer look at product validation of a high-efficiency photovoltaic Power Optimizer by focusing on the GaN-FET buck converter at its core. Proving the absence of overshoot, ringing, EMI risk or premature failure are difficult given the extremely high slew rates. The talk demonstrates why an isolated probe (RT-ZISO) is required for accurate, safe measurements.