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Oct 31, 2023 | Press Release | Test & measurement
Evolved for more challenges: Rohde & Schwarz adds eight-channel R&S MXO 5 to next-generation oscilloscopesWith the all-new R&S MXO 5, Rohde & Schwarz continues to evolve its series of next-generation oscilloscopes, started with the successful R&S MXO 4 in 2022. The R&S MXO 5 is the company’s first eight-channel oscilloscope. It expands upon the industry-firsts pioneered by the R&S MXO 4 and will empower engineers to tackle even more demanding design challenges.
5月 15, 2024 | Press Release | Test & measurement
罗德与施瓦茨推出 MXO 5C 系列,高达2GHz带宽的紧凑型示波器罗德与施瓦茨(以下简称“R&S”)推出 2U机架安装高度示波器/数字转换器,扩展其产品组合,该产品专为机架安装和其他对外形尺寸有要求的应用而量身定制。新型 MXO 5C 系列是公司首款没有集成显示屏的示波器。它具有与之前推出的 MXO 5 系列相同的性能,但垂直高度仅为前者的四分之一。
Oct 01, 2024 | Press Release | Test & measurement
Rohde & Schwarz showcases its cutting-edge test solutions for consumer electronics at CETEX 2024 in AmsterdamCETEX, the all-new Consumer Electronics Test & Development Forum and Expo, invites test and development engineers to RAI in Amsterdam from October 9 to 10, 2024. There, Rohde & Schwarz will exhibit its advanced test and measurement solutions that address the latest emerging challenges in consumer electronics development. Visitors can connect with the company’s experts and explore the latest technologies that help them enhance EMC compliance, debug digital protocols faster, or improve the energy efficiency of their products.
May 27, 2024 | Press Release | Test & measurement
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg from June 11 to 13. This year, the spotlight will be on solutions that address the challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters. The company’s experts will share their first-hand knowledge of applications such as inverter drive design, double pulse testing and EMI debugging, utilizing cutting-edge test instruments from Rohde & Schwarz.
Oct 28, 2024 | Press Release | Wireless communications
Rohde & Schwarz at electronica 2024: Test and measurement solutions from the everyday to the extraordinaryTest and measurement technology leader Rohde & Schwarz with decades of expertise is set to showcase at electronica 2024, held in its home city Munich. Visitors will be able to experience the company’s wide range of solutions designed to help them tackle their test and measurement challenges in the development, verification and production of electronic components and devices – from the everyday to the extraordinary.
1月 23, 2025 | Press Release | Test & measurement
罗德与施瓦茨推出PC端示波器解决方案R&S ScopeStudio,助力研发团队效率跃升罗德与施瓦茨(以下简称“R&S”)推出了创新软件应用R&S ScopeStudio,进一步丰富了其示波器产品线。该应用将MXO系列示波器的强大功能扩展至PC端,为工程师提供了一个更为便捷、高效的工作平台。通过这一先进解决方案,工程师们能够轻松实现示波器测量数据的查看、分析、归档及共享,从而显著提升开发团队的工作效率。
Feb 13, 2025 | Press Release | Test & measurement
Rohde & Schwarz showcases its advanced test solutions for embedded systems at embedded world 2025Embedded systems form the core of modern electronic devices, spanning power input stages, main control PCBs, motors, motor controls, sensors and user interfaces. Each functional block requires comprehensive testing to ensure optimal performance, reliability, and a fast market release of the final product. With its extensive portfolio of advanced test solutions, Rohde & Schwarz empowers design engineers to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.
7月 17, 2024 | Press Release | Electronic design
罗德与施瓦茨为MXO系列示波器配备基于ASIC的区域触发功能,刷新了采集速率记录罗德与施瓦茨(以下简称“R&S”)推出业界首款基于 ASIC 的区域触发功能,进一步加强其示波器产品组合。MXO 系列示波器可提供目前业界最快的区域触发更新率,每秒高达 600,000 个波形,触发事件之间的盲区时间小于1.45 us。与同类区域触发竞品相比,速度最多可提高10,000倍。由于采用了基于ASIC的新型区域触发技术,MXO系列示波器可以精准隔离那些传统触发技术不具灵活性的事件。
6月 11, 2024 | Press Release | Test & measurement
罗德与施瓦茨推出用于精确测量高速开关信号的R&S RT-ZISO 隔离测量系统罗德与施瓦茨(以下简称“R&S”)推出 R&S RT-ZISO 隔离测量系统,进一步提升其高端示波器产品组合。新的 R&S RT-ZISO 能够极其精确地测量高速开关信号,尤其是在高共模电压和电流的环境中。此外,新推出的 R&S RT-ZPMMCX 无源探头配有 MMCX 连接器,可在特定测量任务中与隔离探头系统完美互补。
Apr 29, 2025 | Press Release | Test & measurement
Rohde & Schwarz presents its advanced solutions for power electronics testing and characterization at PCIM Expo 2025Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.
Mar 26, 2024 | Press Release | Test & measurement
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsEmbedded systems are the foundation of today’s electronic devices, spanning sectors as diverse as consumer electronics, telecommunications, industrial, medical, automotive and aerospace applications. Ensuring seamless operation is critical, which means that engineers encounter complex challenges as they design increasingly compact embedded systems and align them with today’s requirements for efficiency, safety, reliability and interoperability. Rohde & Schwarz offers comprehensive test and measurement solutions to meet these challenges and will present its highlights at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
Dec 19, 2024 | Press Release | Automotive
CES 2025: Rohde & Schwarz unveils cutting-edge automotive testing innovations, to ADAS, electric drivetrain and connectivityRohde & Schwarz, a global leader in test and measurement solutions, is excited to unveil its latest innovations and demonstrations at CES 2025. Renowned for its pivotal role in the automotive ecosystem, Rohde & Schwarz consistently makes significant contributions to advancing the industry’s vision of autonomous driving, electrification, and connectivity.
Jan 20, 2025 | Press Release
Rohde & Schwarz to host the 2025 Digital Debug Design Challenge at DesignConVisitors can experience live demonstrations of cutting-edge innovations at DesignCon 2025 and test their skills in the Rohde & Schwarz 'Are you a Genius?' Digital Debug Design Challenge. Moreover, Rohde & Schwarz will host a comprehensive workshop together with leading experts from Samtec, Clear Signal Solutions, University of Colorado Boulder, and Missouri University of Science & Technology.