Electronic Design testing – get in touch with the R&S®MXO 5

Electronic design

Get in touch with the R&S®MXO 5

满足电子电路开发人员需求的测试与测量解决方案

现在,全球化发展的推动因素主要分为两类:最新工业技术及经济趋势的驱动,比如 IoT、工业 4.0 以及绿色能源;以及个人生活方式的根本改变,如电子健康、电子移动、智能家居、智慧城市及社交媒体。所有这些趋势都刺激了对新一代电子设备的强劲需求,旨在满足对可穿戴性、移动性、连接性、性能、电源效率、可靠性和高数据率方面极具挑战的要求。

在这些需求的驱动下,电子工程师在设计开发系统集成架构时将面临更为错综复杂的挑战。我们全面、精密的测试与测量解决方案包括典型的实验器材以及手持式工具,满足下述应用需求

  • 模拟/数字设计和测试
  • 数字总线和接口标准
  • 功率电子
  • 有线电视/DOCSIS

我们的解决方案

数字设计测试

罗德与施瓦茨为信号与电源完整性、数字总线和接口标准、模拟/数字信号的产生与分析、EMC 调试以及数据转换器设计提供广泛的测试与测量解决方案,欢迎选购!

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高速数字接口测试

高速数字接口是所有电子设计的核心。数据率提高,集成密度增加,为集成电路、板卡和系统级设计带来了新的挑战。

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功率电子

借助罗德与施瓦茨的嵌入式功率电子和集成电路、电子设备、照明设备及电驱动装置解决方案全面管理功率电子测试。

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有线电视/DOCSIS

全方位测试 DOCSIS 3.1 电缆调制解调器终端系统 (CMTS)、有线电视网络放大器、激光器、网络组件和电缆调制解调器。

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Rohde & Schwarz at Embedded-world 2024 in Nuremberg

Rohde & Schwarz at embedded world 2024 in Nuremberg

Test & measurement for embedded systems

Solving complex test and measurement challenges requires innovative solutions from a reliable partner.

Join us at our booth in hall 4 I booth 218 from April 9 to April 11, 2024.

FAQs

What is design verification testing?

Verification of a device means checking that the performance of the device matches the expectations both during development and once development is complete. These expectations can be set internally by the organization commissioning the device, or externally by standards also available to other device developers.
For signal processing devices, the increasing complexity and speed of the device, and the reductions in signal levels together make verification ever more complex. Verification involves ensuring that signal values and parameters always remain within acceptable limits under a wide range of conditions.

What is electronics testing?

Electronics testing means checking that a circuit using semi-conductors is performing correctly. While electronics testing includes fundamental properties such as voltage, current, resistance, conductance and capacitance, almost certainly the properties of the signals transmitted by the circuit will be the major reason for testing. Measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band do not require demodulation. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required. The expected results of electronic testing depend on the stage in the life cycle of the device under test (DUT). During development, accurate measurements resulting in values to check against the specification are required. During production, high speed testing with a pass/fail result will meet the test requirements.

What is electronic testing used to test?

So long as “electronic” is taken to mean any circuit using semi-conductors to manipulate electrons, “electronic testing” is used to test any properties of the circuit that can be measured; almost entirely electrical properties, which can be measured at various levels. At the fundamental level, properties such as voltage, current, resistance, conductance and capacitance, can be measured using a multimeter. At the higher level of the signals transmitted by the circuit, measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band, are measured with respect to frequency using signal and spectrum analysis, and with respect to time with oscilloscope functions. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required.

What is signal and power integrity?

In electronics, integrity is whether the expected performance and characteristics of the signal processing from input signal to output signal are being met. Signal integrity refers to the quality of the signal, whether the signal waveform is as anticipated, and the degree to which the waveform is deformed by noise, jitter, and distortion. Power integrity refers to whether the anticipated voltage and current levels are present at all times at the selected test location in the circuit, and parameters such as unplanned variations in level, and planned speed of change in level. Integrity is inevitably associated with testing, as the degree of integrity can only demonstrated by taking measurements and comparing the results to the specification. Poor signal or power integrity results in reduced performance and data transmission errors.

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