测量噪声系数大的设备
出于多种原因，需要测量噪声系数大的组件。例如，多种应用中的低噪声被测设备 (DUT) 使用复杂的测试装置进行特征校准，而这些装置会在连接 DUT 之前或之后产生高损耗。在高频条件下，具备复杂信号路由和电缆的开关矩阵可能产生高损耗。或者，被测设备可能嵌入无法直接操作的测试装置，例如晶圆上探测应用。传统的测量设备即便能够针对此类设备执行噪声系数测量，也会非常不稳定。
This application note describes a technique to perform the noise figure measurement on lossy devices like attenuators, or on devices embedded into in test setups with high loss in front of the low noise amplifiers. The R&S®FSW-K30 noise figure measurement application performs this important measurement with a signal and spectrum analyzer using the Y-factor method. Key for this technique is a modified noise source with high level noise output signal that stimulates the device under test, and a sensitive spectrum analyzer that captures the signal from the device.
Type
应用指南
Version
1e
Date
Jun 24, 2020
Size
570 kB